Title | Nanoscale control of exchange bias with BiFeO3 thin films. |
Publication Type | Journal Article |
Year of Publication | 2008 |
Authors | Martin LW, Chu Y-H, Holcomb MB, Huijben M, Yu P, Han S-J, Lee D, Wang SX, Ramesh R |
Journal | Nano Lett |
Volume | 8 |
Issue | 7 |
Pagination | 2050-5 |
Date Published | 2008 Jul |
ISSN | 1530-6984 |
Abstract | We demonstrate a direct correlation between the domain structure of multiferroic BiFeO3 thin films and exchange bias of Co 0.9Fe 0.1/BiFeO3 heterostructures. Two distinct types of interactions - an enhancement of the coercive field ( exchange enhancement) and an enhancement of the coercive field combined with large shifts of the hysteresis loop ( exchange bias) - have been observed in these heterostructures, which depend directly on the type and crystallography of the nanoscale ( approximately 2 nm) domain walls in the BiFeO3 film. We show that the magnitude of the exchange bias interaction scales with the length of 109 degrees ferroelectric domain walls in the BiFeO 3 thin films which have been probed via piezoresponse force microscopy and X-ray magnetic circular dichroism. |
DOI | 10.1021/nl801391m |
Alternate Journal | Nano Lett. |
PubMed ID | 18547121 |